Ultrafast Submicron Thermoreflectance Imaging
نویسندگان
چکیده
Both the miniaturization of electronic and optoelectronic devices and circuits and the increased operation speeds of electronic devices have exacerbated localized heating problems. Steady-state and transient characterization of temperature distribution in devices and interconnects are important for performance and reliability analysis. In this paper we review recent developments in ultrafast submicron thermoreflectance imaging techniques.
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تاریخ انتشار 2011